SEM-EDX Microplastics image library

This work present SEM-EDX characterisation of Microplastics. Scanning electron microscopy (SEM) can give fast information of morphology, ageing, and origin of the examined samples as it provides high-resolution data of surface state and the qualitative information about the chemical composition (by EDS). The microplastics observed were rich in C, Fe, Si, Al and Co. Cracks, polymer blends and overlays were identified.