SEM-EDX Microplastics image library

This work present SEM-EDX characterisation of Microplastics. Scanning electron microscopy (SEM) can give fast information of morphology, ageing, and origin of the examined samples as it provides high-resolution data of surface state and the qualitative information about the chemical composition (by EDS). The microplastics observed were rich in C, Fe, Si, Al and Co. Cracks, polymer blends and overlays were identified.本研究针对微塑料开展了扫描电子显微镜-能谱联用（SEM-EDX）表征分析。扫描电子显微镜（SEM）可快速获取被测样品的形貌、老化程度与来源信息，因其能够提供样品表面状态的高分辨率数据，并通过能谱仪（Energy Dispersive X-ray Spectroscopy，EDS）获取化学成分的定性分析结果。本次观测到的微塑料富含碳（C）、铁（Fe）、硅（Si）、铝（Al）及钴（Co）元素。研究中还识别出微塑料表面存在裂纹、聚合物共混物及覆盖层。