Data for XRD, SEM-EDX, FT-IR, and XPS analyses for waste foundry dust before and after batch sorption tests using As(III) and Cr(VI) aqueous solutions

Waste foundry dust (WFD), an industrial by-product can be used as a reactive material to treat wastewater. XRD, SEM-EDX, FT-IR, and XPS analyses were performed on WFD samples, obtained before and after the batch sorption tests using As(III) and Cr(VI) aqueous solutions under various conditions (i.e., initial pH and reaction time) for determining As(III) and Cr(VI) removal characteristics. XRD analysis was conducted to determine the change in the mineral phase of the samples after the batch sorption tests. Quartz (SiO2), microcline (KAlSi3O8), and magnetite (Fe3O4) were observed for all samples. For the FT-IR analysis, in all samples, peaks were observed at 585 (Fe-O), 773 (Si-O), 1010 (Si-O-Si), 1560 (C=C), 2115 (C=C), 2340-2372 (O=C=O), and 2650-2700 (C-H) cm-1. The peaks above 1560 cm-1 are related to organic matters in the WFD, and peaks below 1010 cm-1 are related to quartz, microcline, and magnetite. For the SEM-EDX analysis, the major elements detected in the WFD samples before and after the batch sorption tests were Si, Al, and Fe. In addition, a small amount of As and Cr were detected in A-and B-series samples, respectively. For the XPS analysis, 1s peaks for C-C, C-O, and C=O were observed at a binding energy of 284.8, 286.0, and 287.0 eV. Only SiO2 peak for Si 2p was observed at 103.8 eV. Oxygen in all samples was mainly present in the form of SiO2, Fe-O, and M-OH.铸造废粉尘（Waste Foundry Dust，WFD）是一种工业副产物，可作为反应材料用于污水处理。本研究对批量吸附试验前后的WFD样品开展了X射线衍射（X-Ray Diffraction，XRD）、扫描电镜-能谱仪（Scanning Electron Microscopy-Energy Dispersive X-Ray Spectroscopy，SEM-EDX）、傅里叶变换红外光谱（Fourier Transform Infrared Spectroscopy，FT-IR）以及X射线光电子能谱（X-ray Photoelectron Spectroscopy，XPS）分析；上述批量吸附试验以初始pH值、反应时间为变量，采用三价砷（As(III)）与六价铬（Cr(VI)）水溶液进行，旨在明确WFD对As(III)与Cr(VI)的去除特性。XRD分析用于表征批量吸附试验后样品的矿物相变化。所有样品中均检出石英（SiO₂）、微斜长石（KAlSi₃O₈）以及磁铁矿（Fe₃O₄）。傅里叶变换红外光谱分析结果显示，所有样品均在以下波数处出现特征峰：585 cm⁻¹（Fe-O键）、773 cm⁻¹（Si-O键）、1010 cm⁻¹（Si-O-Si键）、1560 cm⁻¹（C=C键）、2115 cm⁻¹（C=C键）、2340~2372 cm⁻¹（O=C=O基团）以及2650~2700 cm⁻¹（C-H基团）。波数高于1560 cm⁻¹的特征峰与WFD中的有机质相关，而波数低于1010 cm⁻¹的特征峰则对应石英、微斜长石与磁铁矿。扫描电镜-能谱仪分析结果显示，批量吸附试验前后的WFD样品中均以硅（Si）、铝（Al）与铁（Fe）为主要元素；此外，A系列样品与B系列样品中分别检出少量砷（As）与铬（Cr）。X射线光电子能谱分析结果显示，C-C、C-O与C=O的1s轨道特征峰分别出现在结合能284.8 eV、286.0 eV与287.0 eV处；Si 2p轨道仅在103.8 eV处出现对应SiO₂的特征峰。所有样品中的氧主要以SiO₂、Fe-O键以及M-OH基团的形式存在。