Ellipsometry raw data of close-to-perfect-monolayer QFS epitaxial graphene on 6H-SiC(0001), analyzed in the publication (DOI: https://doi.org/10.1016/j.apsusc.2023.158617)

The files attached in the folder contain raw experimental data from ellipsometric measurements of close-to-perfect-monolayer quasi-free-standing epitaxial graphene on 6H-SiC(0001). The files contain delta and psi map data. These data were analyzed in the paper "Spectroscopic properties of close-to-perfect-monolayer quasi-free-standing epitaxial graphene on 6H-SiC(0001)" (A. Dobrowolski, J. Jagiełło, K. Piętak-Jurczak, M. Wzorek, D. Czołak, T. Ciuk), published in Applied Surface Science (DOI: https://doi.org/10.1016/j.apsusc.2023.158617).