The AFM micrographs of gold nanoparticles on silicon substrate
收藏Most Wiedzy Open Research Data Catalog2026-04-17 收录
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资源简介：
The dataset contains the first approach towards AFM topographic imaging of gold nanoparticles synthesized and immobilized on the silicon surface. Measurements were made in the semi-contact mode on the NTEGRA Prima device, manufactured by NT-MDT. Scans were performed with amplitude detection at an operating value of 60% of the free oscillation amplitude. Probe parameters: spring constant: 31.5 N / m, length / width / thickness: 125/40/4 µm. Tip curvature radius 10 nm.
提供机构：
Jacek Ryl; Paweł Niedziałkowski; Artur Zieliński
