Vibrational EELS Linescans
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下载链接：
https://figshare.com/articles/dataset/Vibrational_EELS_Linescans/9642950
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资源简介：
Scanning Transmission Electron Microscopy (STEM)
Vibrational Electron Energy Loss Spectroscopy (EELS) line scans across
silicon atomic columns. The scan direction followed the [110]
crystallographic direction of the material. A linescan across a
silicon/silicon dioxide interface is also included. Simultaneously acquired high angle annular dark field (HAADF) signals are also included for each EELS line scan.
Details
of the acquisition of the data can be found in the related article in Nature Physics
by Venkatraman, Levin, March, Rez & Crozier. A link to article is given below.
创建时间：
2019-08-30
