Experimental_Photoelectron_spectroscopy_CNx_Pt_WP2-3_NASU

Measurements were performed under WP2-3, task 1.2.2 GRM-based foam and porous materials in UC10. The main purpose of the research is investigation of chemical composition and chemical bonds of nitrogenated amorphous carbon films deposited under various regimes and doped with transition metals (Pt). X-ray photoelectron spectroscopy measurements were performed for the amorphous carbon film samples deposited in magnetron sputtering processes using gas mixture N2/CH4 (1:1) with presence of Si (KO529 sample) or graphite (KO530 sample) targets at 200 W (KO529 sample) or 100 W (KO530 sample) discharge power. Data set contains both survey and detailed core levels spectra of CNx samples at different stages of treatment (vacuum annealing at 750℃, Pt doping, post- vacuum annealing at 750℃), for more details see corresponding Note column in dataset (brackets are used to indicate the sequence of annealing/doping procedures). Binding energy column unit is eV, Intensities in cps.