Data for: Effect of bending test on the performance of CdTe solar cells on flexible ultra-thin glass produced by MOCVD

The photovoltaic performance was measured by J-V under AM1.5G at 25 ⁰C following a 10 minutes light soak, using an ABET Technologies Sun 2000 Solar Simulator. The measurements were performed when the cell was in a planar state, and then when flexed to a 40 mm and subsequent 32 mm bend radius. After flexion the device was relaxed and measured flat. In addition, the sample was held at a bend radius of 32 mm for 168 hours with measurement at 0, 24, 48, 120, 144 and 168 hours. Again, the sample was measured flat before and after the bending test. Additionally, external quantum efficiency (EQE) and capacitance voltage (C-V) measurements were performed before and after 168 hours bending test. A Bentham PVE300 photovoltaic spectrometer was used for EQE measurements and a Solartron analytical modulab model 2100A was used for C-V measurements. Residual stress measurements were made with a Bruker D8 Discover X-ray diffraction system. The equipment was set up in a point mode with a polycapillary element and nickel filter. Scans were made with a 0.02° step size, at a time of 1 second per step. The scans were over the full 0−0.45 sin2(ψ) in both positive and negative ψ tilts to confirm the absence of shear stress. Peak evaluation was undertaken using the Pearson VII fitting and stresses were calculated using a normal stress model. The Diffrac, Leptos software was used to model the peaks, then the peak shift was changed to strain using the Poisson’s ratio of 0.2 and Young’s Modulus of 77000MPa. This data was then plotted with strain vs the sin2(ψ) value.光伏性能通过J-V测试法在AM1.5G标准光照、25℃条件下测定，测试前先进行10分钟光浸泡预处理，测试设备为ABET Technologies Sun 2000太阳能模拟器。测试首先在光伏电池处于平整状态时开展，随后分别将其弯折至40毫米、继而32毫米的弯曲半径进行测试；弯折完成后将器件静置恢复，再进行平整状态下的性能测试。此外，将样品保持在32毫米弯曲半径的状态下168小时，分别在0、24、48、120、144及168小时节点进行性能测试；同样，在该弯折测试的前后均对样品进行平整状态下的测试。另外，在168小时弯折测试前后，分别开展外量子效率（External Quantum Efficiency, EQE）与电容-电压（Capacitance Voltage, C-V）测试；其中EQE测试采用Bentham PVE300光伏光谱仪，C-V测试使用Solartron analytical modulab 2100A型分析仪。残余应力测试采用Bruker D8 Discover X射线衍射系统，该设备设置为点扫描模式，配置有多毛细管元件与镍滤光片；扫描步长设为0.02°，每步采集时长为1秒，扫描覆盖完整的0~0.45 sin²(ψ)范围，同时进行ψ角正负方向倾斜扫描，以确认无剪切应力存在。测试采用Pearson VII拟合算法进行峰形解析，并基于正应力模型计算应力值；使用Diffrac、Leptos软件完成峰形建模，随后利用泊松比（Poisson's ratio）0.2与杨氏模量（Young's Modulus）77000MPa，将峰位偏移量转换为应变值，最终将应变与sin²(ψ)值的对应关系绘制成曲线。