Determination of thermal reversible and irreversible effects during crystal irradiation at 4th generation synchrotrons

We want to determine, by means of single crystal X-ray nanodiffraction, the relative amount of reversible and irreversible changes taking place in the crystal lattice of a few different materials as a consequence of X-ray irradiation. The importance of lattice heating will be addressed and compared to numerical models, gaining knowledge about the lattice temperature evolution, lattice damage and on the possible routes for defect engineering.