Symmetrization and calculation of LEED intensity patterns

Title of program: LEED BEAM-SYMMETRIZED Catalogue Id: ACKG_v1_0 Nature of problem Experiments with low energy electron diffraction(LEED)are used for finding the composition of the unit mesh of crystal-overlayer (crystal plus overlayer) structures.... CORRECTION SUMMARY: Vol:Year:Page 0:unpublished:unpublished "000ACORRECTION 12/09/75" "Unpublished correction to symmetrization and calculation of LEED intensity patterns." J. Rundgren; A. Salwen Note: correction instructions are contained in source code Versions of this program held in the CPC repository in Mendeley Data ACKG_v1_0; LEED BEAM-SYMMETRIZED; 10.1016/0010-4655(75)90083-1 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)程序名称：LEED BEAM-SYMMETRIZED 目录编号：ACKG_v1_0 问题本质 低能电子衍射（Low Energy Electron Diffraction, LEED）实验可用于解析晶体-覆盖层（晶体与覆盖层构成的体系）结构的单位网格组成…… 修正摘要： 卷:年份:页码 0:未出版:未出版 "000ACORRECTION 12/09/75" "针对LEED强度图样的对称化与计算的未出版修正" J. Rundgren; A. Salwen 注：修正说明包含于源代码中 该程序在孟德利数据（Mendeley Data）的CPC程序库中的版本信息为： ACKG_v1_0; LEED BEAM-SYMMETRIZED; 10.1016/0010-4655(75)90083-1 本程序源自贝尔法斯特女王大学托管的CPC程序库（1969-2019年）