SEM Images for carbon material with KOH activation
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Field-emission scanning electron microscopy (FE-SEM, JEOLJEM-1011) at 100 kV was applied to observe the morphology of samples.
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2020-10-21
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Field-emission scanning electron microscopy (FE-SEM, JEOLJEM-1011) at 100 kV was applied to observe the morphology of samples.