High Piezoelectric Property with Exceptional Stability in Self-Poled Ferroelectric Films
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The experimental measurements that generate raw profiles in this study, such as the dielectric and ferroelectric property characterization, X-ray Photoelectron Spectroscopy, Raman, and X-ray diffraction characterizations. The name of the file obeys the rule of discriminating the sample type or the measurement type.
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2024-11-08
