Raman Spectroscopy Data for AlₓGa₁−ₓAs Nanostructures Synthesized by Wet Electrochemical Deposition under Different Voltage Regimes

This dataset contains processed Raman spectroscopy data supporting the results presented in the article “Wet Chemical Synthesis of AlₓGa₁−ₓAs Nanostructures: Investigation of Properties and Growth Mechanisms”. The dataset includes Raman spectra of three AlₓGa₁−ₓAs samples synthesized on textured GaAs substrates under different electrochemical deposition regimes: voltage switching, gradual voltage increase, and pulsed voltage. Raman spectroscopy was used to assess crystalline quality, phonon mode evolution, and structural disorder as a function of aluminum incorporation and growth conditions. Only processed Raman spectra and derived tabulated results are provided. Raw spectral data and full instrumental settings are not included. An OriginLab project file (*.opju) containing the processed Raman spectra and comparative visualization used for figure preparation is provided to ensure transparency of data handling and plotting. This dataset underpins the Raman analysis presented in the associated article and enables reuse for comparative vibrational analysis of electrochemically synthesized AlₓGa₁−ₓAs nanostructures. A detailed description of the dataset structure and reuse notes is provided in the accompanying README.md file Methods Raman spectroscopy was employed to investigate the vibrational properties and crystalline quality of AlₓGa₁−ₓAs nanostructures synthesized under different electrochemical deposition regimes. Raman spectra were recorded in the spectral range covering the characteristic phonon modes of GaAs- and AlAs-related lattice vibrations. The dataset includes processed Raman spectra for three samples prepared under distinct electrochemical voltage regimes. Data processing involved baseline correction, normalization, and peak fitting to extract peak positions and full widths at half maximum (FWHM). Changes in phonon peak positions and linewidths were analyzed to assess alloy composition effects, crystalline quality, and structural disorder. Comparative visualization and plotting were performed using OriginLab software. Content of the dataset The dataset includes: Processed Raman spectra for three AlₓGa₁−ₓAs samples (Sample 1–3); Tabulated Raman peak positions for characteristic phonon modes; Tabulated FWHM and peak intensity values used to assess crystalline quality; An OriginLab project file (*.opju) containing processed Raman spectra and comparative visualization; A sample identification table linking Raman data to electrochemical deposition regimes. All tabulated data are provided in open formats