cross-sectional scanning diffraction tests on FeCr alloys and silicon chips in EH3

Name: cross-sectional scanning diffraction tests on FeCr alloys and silicon chips in EH3
Creator: European Synchrotron Radiation Facility
Published: 2022-09-12T06:00:15+08:00

DataCite Commons2022-09-12 更新2025-04-15 收录

材料微观结构表征

电子衍射

数据链接：

https://doi.esrf.fr/10.15151/ESRF-ES-924289398 数据链接链接失效反馈

官方服务：

资源简介：

cross-sectional scanning diffraction tests on FeCr alloys and silicon chips in EH3

提供机构：

European Synchrotron Radiation Facility

创建时间：

2022-09-12

cross-sectional scanning diffraction tests on FeCr alloys and silicon chips in EH3

资源简介：

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