Determining Beam Usage Limits for Microelectronic Components
收藏DataCite Commons2025-01-26 更新2025-04-15 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-1994104801
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资源简介：
The application objective is to evaluate the pulse intensity as a function of photon energy, the use of an attenuator system and the pulse duration on encapsulated and unencapsulated microelectronic components to systematize the beam parameters and evaluate their equivalence from a microelectronics point of view.
提供机构：
European Synchrotron Radiation Facility
创建时间：
2025-01-26
