Supporting information to derive the figures of the paper: "Wafer-scale low-disorder 2DEG in 28Si/SiGe without an epitaxial Si cap"
收藏DataCite Commons2022-08-30 更新2024-07-03 收录
下载链接：
https://data.4tu.nl/articles/_/19181597/1
下载链接
链接失效反馈官方服务：
资源简介：
The data sets provide the necessary information to derive the figures of the paper "Wafer-scale low-disorder 2DEG in 28Si/SiGe without an epitaxial Si cap" Preprint at https://arxiv.org/abs/2202.08090
提供机构：
4TU.ResearchData
创建时间：
2022-04-13
