The effect of the graded bilayer design on the strain depth profiles and microstructure of CuW nano-multilayers
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In this document we share: -the XRD in-plane scans acquired on Cu/W multilayers at different incidence angle, -the in-situ stress curvature data acquired during multilayer growth, -the in plane d-spacing derived at different incidence angle, used for the simulation of the strain gradient.
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2021-07-13
