Data related to visual method of thickness determination for exfoliated flakes of 2D magnet semiconductor CrSBr
收藏DataCite Commons2024-03-26 更新2025-04-16 收录
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https://repod.icm.edu.pl/citation?persistentId=doi:10.18150/KUQFYX
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资源简介：
The dataset contains the source data for figures presented in poster presentation "Extension of rapid estimation of the flake thickness by color fora magnetic van der Waals 2D material", which was presented at 51st International School & Conference on the Physics of Semiconductors „Jaszowiec 2023”
提供机构：
RepOD
创建时间：
2024-03-18
