Understanding Radiation-induced Effects in State-of-the-Art Embedded Processors

The susceptibility of electronic devices to atmospheric radiation is no longer just of concern to the aerospace industry. At sea level, a 100,000-device deployment can expect to experience a radiation-induced failure once every few hours. System reliability is thus of ever-increasing concern, particularly in safety-critical scenarios including in the automotive and health sectors, wherein the use of performance-demanding machine learning applications is increasingly desired. We wish to increase our knowledge of radiation-induced effects in modern electronic devices, particularly embedded CPUs, and gauge the effectiveness of techniques designed to increase their reliability.电子设备对大气辐射的敏感性，如今已不再仅为航空航天领域所关注。在海平面高度，部署10万台电子设备时，每隔数小时便可能发生一次辐射诱导故障。因此，系统可靠性愈发受到重点关切，尤其在汽车、医疗等安全关键场景中——此类场景对高性能机器学习应用的需求正持续攀升。本数据集旨在加深我们对现代电子设备（尤其是嵌入式中央处理器（embedded CPU））受辐射诱导效应的认知，并评估用于提升其可靠性的各类技术的有效性。