Electrical characterization of thermal vacuum grown Sn whiskers (conductivity and break down voltage)

Name: Electrical characterization of thermal vacuum grown Sn whiskers (conductivity and break down voltage)
Creator: RepOD
Published: 2026-06-18T09:29:46+08:00

RepOD Repository for Open Data2026-06-18 更新2026-07-23 收录

锡晶须电学表征

电子封装可靠性

数据链接：

https://repod.icm.edu.pl/dataset.xhtml?persistentId=doi:10.18150/YV3PNW 数据链接链接失效反馈

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资源简介：

Balázs, Illés; Skwarek, Agata; Brzozowski, Ernest; Adam, Łaszcz; Zachariasz, Piotr, 2026, "Electrical characterization of thermal vacuum grown Sn whiskers (conductivity and break down voltage)", https://doi.org/10.18150/YV3PNW, RepOD, V1

提供机构：

RepOD

创建时间：

2026-06-18

Electrical characterization of thermal vacuum grown Sn whiskers (conductivity and break down voltage)

资源简介：

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