Rough surface - Sample ID P54
收藏DataCite Commons2024-10-23 更新2025-04-09 收录
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https://contact.engineering/go/mhte7
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资源简介：
An XE-100 atomic force microscope (AFM, Park Systems) was used in contact mode with a NSC36C cantilever (Park Systems). The cantilever had a force constant of 0.6 N/m, resonant frequency of 65 kHz, length of 130 ± 5 μm, width of 32.5 ± 3 μm, and thickness of 1.0 ± 0.5 μm. Images were acquired at scan sizes of 2 μm, 3 μm, 4 μm, 5 μm, 10 μm, and 30 μm at a scan rate of 1 Hz.
提供机构：
contact.engineering
创建时间：
2024-10-23
