High-resolution XRF analysis of sediment core IZN19-16 from Lake Iznik (NW Turkey)

The relative contents of major and trace elements were analyzed in 2019 with an X-Ray Fluorescence (XRF) at 1-mm resolution on the surface of each sediment core with an Avaatech Core Scanner (EDYTEM Laboratory). The split-core surface was first covered with a 4-μm-thick Ultralene film to avoid contamination and desiccation of the sediment. Element intensities are expressed in counts per second (cps). Different settings were used with 10 kV and 0.2 mA during 15 s to detect Al, Si, S, K, Ca, Ti and at 30 kV and 0.3 mA during 20 s for Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr, Zr, Pb (Richter et al., 2006; doi:10.1144/GSL.SP.2006.267.01.03).

2019年，依托EDYTEM实验室的Avaatech岩心扫描仪，采用X射线荧光光谱法（X-Ray Fluorescence, XRF）对每根沉积物岩心表面以1毫米的分辨率开展主量与微量元素相对含量分析。为避免沉积物受到污染与发生干燥脱水，首先将劈开的岩心表面覆盖一层厚度为4微米的Ultralene防护膜（Ultralene film）。元素强度以每秒计数（counts per second, cps）为单位进行表征。本次分析采用两组不同的仪器参数设置：以10 kV、0.2 mA的条件扫描15秒，用于检测Al、Si、S、K、Ca、Ti元素；以30 kV、0.3 mA的条件扫描20秒，用于检测Mn、Fe、Ni、Cu、Zn、Br、Rb、Sr、Zr、Pb元素（Richter等，2006；doi:10.1144/GSL.SP.2006.267.01.03）。