x-ray diffraction for iron oxide
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This dataset contain the XRD data for the prepared iron oxid, that synthesized via electrochemical deposition for the figures (6,7,8) in manuscript [Cold Plasma as a Novel Annealing Technique: A Comparative Study with Thermal Annealing on the Structural and Morphological Properties of Nickel and Iron Oxide]. Were measured using X-ray diffraction instrument from the Netherlands by Philips Company (PW1730).
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2025-10-25



