Data underlying the publication: Device-Aware Test for Ion Depletion Defects in RRAMs

The raw data of a defect-free RRAM I-V curve, which can be seen in Fig. 10 (a). The data set can help researcher to make an I-V curve or R-V curve of a HfO2 based RRAM device.本数据集包含无缺陷阻变随机存取存储器（RRAM）的原始电流-电压（I-V）曲线数据，如图10(a)所示。该数据集可辅助研究人员绘制基于氧化铪（HfO₂）的RRAM器件的I-V曲线或电阻-电压（R-V）曲线。