Scattered light pattern measurements on intact and defect InGaN-samples

The dataset consists of a total of 12 scattered light intensity measurements of InGaN nanowire samples. Each file contains the data from one measurement run. Six of the measurement runs were taken on intact samples ('nd'), whilst the remaining six were carried out on samples exhibiting surface defects in the form of low wire densities and short wire lengths ('d').
The measurements were carried out using the setup described in the citing publication and covered a section of the scattered light sphere comprising 89 x 27 measurement points with a step size of 1° in elevation and azimuth direction. The intensities are captured in auxiliary units, since only the intensity relation between the measurement positions is of interest. The experimental data about the measurement procedure, the laser, the detector etc. can be found in the citing publication.