X-ray beam characterization of an aberration-corrected pair of planar nanofocusing X-ray lenses with ptychography

This data set is split over two zip archives. Each archive contains a scanning coherent X-ray diffraction (ptychography) data set recorded at an X-ray energy of 18 keV. A crossed pair of planar nanofocusing X-ray lenses (NFL) made out of silicon is used to focus the beam and scan a Siemens star test sample. Each data set includes a configuration file and scan position file. In addition, the final result of the obtained ptychographic reconstruction is included. Description of the two data sets: scan_00033: X-ray beam characterization of the NFL. On this data set the design of the refractive phase correctors was based upon. scan_00077: X-ray beam characterization of the NFL with refractive phase corrector milled to the silicon lens by focused ion-beam milling. Additional information: The diffraction patterns can be found in the 'eiger4m_01' folder. They are split up over multiple h5 files and located in the group '/entry/data/data'. The assignment of diffraction patterns to scan positions can be found in the positions.txt file. All relevant input parameters for ptychography are located in the 'input' group in the ptycho.conf files. The reconstruction results are in the European Data Format (EDF). The data set has been published in: F. Seiboth, A. Schropp, M. Lyubomirskiy, W. Wang, A. Jahn, S. Kulkarni, T. F. Keller, and C. G. Schroer, "On-chip aberration correction for planar nanofocusing x-ray lenses by focused ion-beam milling," Applied Physics Letters 122(24), (2023).

本数据集分为两个压缩归档包。每个归档包均包含一组在18 keV X射线能量下采集的扫描相干X射线衍射叠层成像（ptychography）数据集。实验采用硅基平面纳米聚焦X射线透镜（planar nanofocusing X-ray lenses, NFL）的交叉对结构来聚焦X射线束，并对西门子星测试样品进行扫描。每个数据集均包含配置文件与扫描位置文件，此外还附带所得叠层成像重建任务的最终结果。

两个数据集的具体说明如下：
scan_00033：针对平面纳米聚焦X射线透镜（NFL）的X射线束表征数据集，该数据集为折射相位校正器的设计提供了核心依据。
scan_00077：搭载通过聚焦离子束铣削加工至硅透镜的折射相位校正器的平面纳米聚焦X射线透镜（NFL）的X射线束表征数据集。

附加说明：衍射图案可在`eiger4m_01`文件夹中获取，其被拆分为多个h5文件，存储于组路径`/entry/data/data`下。衍射图案与扫描位置的对应关系可查阅`positions.txt`文件。所有叠层成像相关的输入参数均存放于`ptycho.conf`文件的`input`组中。重建结果采用欧洲数据格式（EDF）存储。

本数据集已发表于以下论文：
F. Seiboth、A. Schropp、M. Lyubomirskiy、W. Wang、A. Jahn、S. Kulkarni、T. F. Keller 与 C. G. Schroer，题为"On-chip aberration correction for planar nanofocusing x-ray lenses by focused ion-beam milling"，发表于《应用物理快报》（*Applied Physics Letters*）122(24)，2023年。