X-ray diffraction of ZnIn2S4 layers on TiO2NT and FTO annealed at different temperatures
收藏Mendeley Data2024-01-31 更新2024-06-27 收录
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资源简介：
Data show XRD results for ZnIn2S4 layers deposited using hydrothermal method on FTO glass and TiO2 nanotubes. The layers were annealed in air atmosphere at 300, 400 and 500 oC.
创建时间：
2024-01-31
