Data underlying the publication: In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells

Data corresponding to the publication 'In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells' in ACS Applied Materials and Interfaces. The data are composed of X-ray reflectometry (XRR), Grazing Incidence X-ray diffraction (GIXRD) and lifetime measurements of passivating contacts for c-Si solar cells. <br>

本数据集对应发表于《ACS应用材料与界面》（ACS Applied Materials and Interfaces）的学术论文《用于晶体硅（c-Si）太阳能电池的p型多晶硅钝化接触的多尺度结构原位反射与衍射研究》。该数据集包含针对晶体硅太阳能电池钝化接触的X射线反射法（X-ray reflectometry, XRR）、掠入射X射线衍射（Grazing Incidence X-ray diffraction, GIXRD）以及寿命测试的相关测量数据。