Practical considerations for microstructure mapping with direct electron detector-based electron backscatter diffraction
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Data accompanying the manuscript of the same title. Contents include: Sample patterns.zip: Image files of individual patterns used in the figures. Raw data of Si patterns for parametric studies Si_20keV_exposure: figure 2 Si_20kev_BC_TH_10ms: figure 3 Si_20keV_MEC: figure 4 Si_10keV: figure 5 Si_5keV: figure 6 Raw data of microstructure maps SiC Ni, in four parts (*) Ti, in three parts (*) * due to difficulties encountered in uploading, multiple .zip files are used for these datasets. For viewing in xTalView, please unzip the contents into the same folder.
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Zenodo创建时间：
2025-08-13
