XPS Survey spectra of Graphene oxide

XPS spectra were obtained in a Kratos Axis Ultra DLD irradiating the samples with an Al monochromatic Kα radiation of energy (1486.6 eV) at a power of 150 W. Survey spectra of all samples were performed with pass energy of 160 eV. Graphite XPS spectra presents its main peak related to the energy layer C1s (at 285 eV) of the carbon element, while the GOs spectra are composed by two main peaks, related to the photoelectrons emitted in the energy layers C1s (at 285 eV) and O1s (at 531 eV) of carbon and oxygen elements.

本实验采用Kratos Axis Ultra DLD型X射线光电子能谱仪（X-ray Photoelectron Spectroscopy，XPS）进行表征，以能量为1486.6 eV的单色Al Kα射线作为激发源辐照样品，激发功率设置为150 W。所有样品的全谱扫描均采用160 eV的通能。石墨样品的XPS谱图存在对应碳元素C1s能级（结合能285 eV）的主峰；而氧化石墨烯（Graphene Oxides，GOs）样品的XPS谱图则包含两个主峰，分别对应碳元素C1s能级（结合能285 eV）与氧元素O1s能级（结合能531 eV）所发射的光电子信号。