Mapping mechanical properties of various layered materials by x-ray speckle imaging
收藏ESRF Portal2024-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-421137170
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资源简介：
By using a compression system with a tomographic setup (tomopress), one can assess the mechanical properties of a sample. Speckle Imaging allows to measure up to a hundredth of a pixel structural movement. By coupling these two technics, we aim to map in fine detail the inner mechanical properties of an aluminum, wood, and polymer sample.
创建时间：
2024-01-01
