Data for: Structure distortion and magnetic properties of Ru-doped H-LuMnO3

At room temperature, the crystal structure of the samples was detected by X-ray diffraction (XRD). Using an Ar+ excitation source (λ= 633nm) measured Raman spectra with a liquid-nitrogen-cooled device. Superconductor quantum interference device magnetometer (SQUID) was used to characterize the relationship between the temperature(T) dependence of magnetization(M) with the temperature ranging from 5 K to 300 K and the external magnetic field of 10KOe. At low temperature (5 K), the hysteresis loops (M-H loop) of the samples were measured with an applied magnetic field range was from -50kOe to -50kOe.

室温下，通过X射线衍射（X-ray Diffraction, XRD）表征样品的晶体结构。采用氩离子（Ar⁺）激发源（波长λ=633 nm）搭配液氮冷却装置采集样品的拉曼光谱。使用超导量子干涉器件磁强计（Superconductor Quantum Interference Device Magnetometer, SQUID），表征了温度区间5 K至300 K、外磁场为10 kOe时，磁化强度（M）随温度（T）的变化关系。在低温（5 K）条件下，测试了样品的磁滞回线（M-H回线），其施加的外磁场范围为-50 kOe至-50 kOe。