X-Ray Fluorescence and Reflectography Data from Leipzig, Universitaetsbibliot...
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https://b2find.eudat.eu/dataset/b4ac81ca-6af4-5831-b9e7-3a9623e7f05c
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资源简介：
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from...
