Research data supporting “Strongly exchange-coupled triplet pairs in an organic semiconductor”

Text files of (1) transient electron spin resonance (ESR) of TIPS-Tetracene as a function of temperature taken at X-band frequencies (~9.6 GHz) in a home-build transient ESR spectrometer, time slices are taken at 300 ns after laser flash in a TIPS-Tetracene film (2) Rabi nutation time traces of Hahn echo intensity as a function of microwave pulse length taken on a Bruker E580 spectrometer configured for X-band using a dielectric resonator for a TIPS-Tetracene film and macrocrystalline sample (3) Hahn echo decay time traces showing the decay of the Hahn echo as a function of delay between a 90 degree and 180 degree microwave pulse for a TIPS-Tetracene film and macrocrystalline sample. (4) Transient ESR intensity time traces taken at 10K in a TIPS-Tetracene film (5) metadata file with any necessary information to understand what each file corresponds to. Details of the experimental setup and corresponding figures can be found in the corresponding publication.

本数据集包含以下五类文本文件：
1. 针对TIPS-并四苯（TIPS-Tetracene）薄膜样品，使用自制瞬态电子自旋共振（transient electron spin resonance, ESR）波谱仪，在X波段频率（约9.6 GHz）下采集的温度依赖型瞬态ESR数据，数据选取激光闪射后300 ns处的时间切片。
2. 针对TIPS-并四苯薄膜与宏观晶体样品，采用配置X波段介质谐振器的布鲁克E580（Bruker E580）波谱仪，采集的以微波脉冲时长为变量的哈恩回波（Hahn echo）强度拉比进动（Rabi nutation）时间轨迹。
3. 针对TIPS-并四苯薄膜与宏观晶体样品，采集的以90°与180°微波脉冲间延迟时间为变量的哈恩回波衰减时间轨迹，该轨迹表征哈恩回波信号的衰减特性。
4. 针对TIPS-并四苯薄膜样品，在10 K温度下采集的瞬态ESR强度时间轨迹。
5. 用于说明各文件对应内容的元数据文件，包含理解数据集所需的全部必要信息。
本数据集的实验装置细节与对应图表可参见相关发表论文。