Optimizing Non-Rigid Registration for Scanning Transmission Electron Microscopy Image Series
收藏DataCite Commons2024-02-26 更新2024-07-13 收录
下载链接：
https://www.materialsdatafacility.org/detail/zhang_nrr_stem_v1.1
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资源简介：
High-resolution Z-contrast / HAADF STEM image series on SrTiO_3 crystals as a function of pixel dwell time and number of images in the series. Used for testing precision after non-rigid registration and averaging. Data analysis codes and example Jupyter libraries included.
提供机构：
Materials Data Facility
创建时间：
2020-04-27
