REX — a least-squares fitting program for the simulation and analysis of X-ray reflectivity data

Abstract
A FORTRAN program REX, which has been developed to facilitate the interpretation of X-ray reflectivity data, is described. The program allows the simulation of reflectivity profiles as a function of either incident angle or of energy. Factors such as anomalous dispersion, and surface and interface roughness are taken into account in the model. In addition, experimental data of reflectivity as a function of incident angle can be matched to user-supplied theoretical parameters by a least-square...

Title of program: REX
Catalogue Id: ACPI_v1_0

Nature of problem
Interpretation of X-ray reflectivity spectra from thin films or multilayers.

Versions of this program held in the CPC repository in Mendeley Data
ACPI_v1_0; REX; 10.1016/0010-4655(93)90188-I

This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)

摘要
本文介绍了一款为辅助X射线反射率（X-ray reflectivity）数据解析而开发的FORTRAN程序REX。该程序可模拟以入射角（incident angle）或入射能量为自变量的反射率分布曲线。模型中已纳入反常色散（anomalous dispersion）、表面与界面粗糙度等关键影响因素。此外，程序可通过最小二乘法（least-square）将与入射角相关的反射率实验数据与用户提供的理论参数进行拟合……

程序名称：REX
目录编号：ACPI_v1_0

问题所属范畴：用于解析薄膜或多层膜的X射线反射光谱。

本程序收录于Mendeley数据平台的CPC程序库中，版本信息为：ACPI_v1_0；REX；10.1016/0010-4655(93)90188-I

本程序源自贝尔法斯特女王大学托管的CPC程序库（1969-2019）。