Data: Excellent strength-ductility combination, in the absence of twinning, in a novel single-phase VMnFeCoNi high-entropy alloy

This data set contains the following data:
Figure 1- Solvus temperature: This folder contains backscatter electron images of VMnFeCoNi specimens cast, homogenized, cold-worked and annealed between 1000 and 1100 °C for 1 h. File name format is alloy composition_ recrystallization (RX)_temperature of annealing_ duration of annealing.
Figure 2- SEM standard state: This folder contains two subfolders relating to electron back scatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDX) data of VMnFeCoNi recrystallized at 1080°C, 30 min, labeled EBSD and EDX maps, respectively. EBSD contains the processed inverse pole figure map and the inverse pole figure density texture plot, as well as the raw EBSD scan data in the .ctf format, segmented in two subfolders labelled Plots and Raw ctf data, respectively. EDX maps contains the BSE image and corresponding EDX elemental concentration maps for Co, Fe, Mn, Ni, and V.
Figure 3- TEM standard state: This folder contains two subfolders relating to transmission electron microscope (TEM) bright field (BF) and selected area diffraction (SAD) as well as TEM-EDX data of VMnFeCoNi recrystallized at 1080°C, 30 min, labeled BF_SAD and EDX, respectively. BF_SAD contains the BF and corresponding SAD images. EDX maps contains the electron image and corresponding EDX elemental concentration maps for Co, Fe, Mn, Ni, and V.
Figure 4- Tensile_data: Tensile data including, engineering stress-strain data for VMnFeCoNi samples deformed to 10 % strain, 25 % strain and failure (homogeneous engineering strain: 60%) at RT. Additional true-stress-strain data and associated work-hardening rates for samples deformed to failure are also included (shared in the .dat format). Naming format: alloy composition_recrystallized (RX)_ annealing temperature_annealing time duration_ serial number if deformed to fracture/strain at which test was interrupted.
Figure 5- TEM deformed state: TEM-BF and SAD images of samples deformed to 10% tensile strain, 25 % tensile strain, and to fracture.
Figure S1- Sigma confirmation: This folder contains two subfolders relating to EBSD processed and raw data of VMnFeCoNi recrystallized at 1000°C, 1h, labeled Plots and Raw ctf data, respectively. Plots contains the processed inverse pole figure map, phase map, and two example Kikuchi patterns from two different sigma phase particles. The folder Raw ctf data contains the raw EBSD data in the .ctf format.
Figure S2- Oxide confirmation: Contains the BSE image showing where the EDX line scan was carried out for the EDX data shown in Figure S2, and associated data in .dat format.
Grain_size_BSE: This folder contains the raw BSE images that were used to calculate the grain and crystallite size in equiatomic VMnFeCoNi recrystallized at 1080 °C, 30 min via linear intercept method. Naming format: recrystallized (RX)_ annealing temperature_annealing time duration_ serial number.

本数据集包含以下数据：
图1- 固溶温度（Solvus temperature）：该文件夹包含经铸造、均质化、冷加工并在1000~1100℃退火1小时的VMnFeCoNi合金试样的背散射电子图像（backscatter electron images）。文件命名格式为：合金成分_再结晶（Recrystallization, RX）温度_退火时长。
图2- SEM标准态：该文件夹包含两个子文件夹，分别对应在1080℃下退火30分钟再结晶的VMnFeCoNi合金的电子背散射衍射（electron back scatter diffraction, EBSD）数据与能量色散X射线能谱（energy dispersive X-ray spectroscopy, EDX）图，子文件夹分别命名为EBSD与EDX maps。其中EBSD文件夹包含处理后的反极图、反极图密度织构图，以及两类子文件夹：Plots（绘图数据）与Raw ctf data（原始.ctf格式EBSD扫描数据）。EDX maps文件夹包含背散射电子图像以及Co、Fe、Mn、Ni、V五种元素对应的EDX元素浓度分布图。
图3- TEM标准态：该文件夹包含两个子文件夹，分别对应在1080℃下退火30分钟再结晶的VMnFeCoNi合金的透射电子显微镜（transmission electron microscope, TEM）明场（bright field, BF）与选区电子衍射（selected area diffraction, SAD）数据，以及TEM-EDX数据，子文件夹分别命名为BF_SAD与EDX。BF_SAD文件夹包含明场图像与对应的选区电子衍射图像。EDX maps文件夹包含电子图像以及Co、Fe、Mn、Ni、V五种元素对应的EDX元素浓度分布图。
图4- 拉伸测试数据（Tensile_data）：包含VMnFeCoNi合金试样在室温（Room Temperature, RT）下变形至10%应变、25%应变以及断裂（均匀工程应变为60%）的工程应力-应变（engineering stress-strain）数据。此外还包含试样断裂过程中的真实应力-应变（true-stress-strain）数据以及对应的加工硬化率（work-hardening rates）数据，均以.dat格式（.dat format）存储。命名格式为：合金成分_再结晶（RX）_退火温度_退火时长_拉伸中断时的应变编号（若试样发生断裂则标注为fracture）。
图5- 变形态TEM：包含拉伸变形至10%应变、25%应变以及断裂的试样的TEM明场与选区电子衍射图像。
补充图S1- σ相确认（Sigma confirmation）：该文件夹包含两个子文件夹，分别对应在1000℃下退火1小时再结晶的VMnFeCoNi合金的EBSD处理后数据与原始数据，子文件夹分别命名为Plots与Raw ctf data。Plots文件夹包含处理后的反极图、相图，以及两种不同σ相（sigma phase）颗粒的菊池花样（Kikuchi patterns）示例。Raw ctf data文件夹包含.ctf格式的原始EBSD数据。
补充图S2- 氧化物确认（Oxide confirmation）：包含用于展示EDX线扫位置的背散射电子图像（对应补充图S2中的EDX数据），以及对应的.dat格式关联数据。
Grain_size_BSE：该文件夹包含用于通过线截法（linear intercept method）计算等原子比VMnFeCoNi合金（在1080℃退火30分钟再结晶）的晶粒与微晶尺寸的原始背散射电子图像。命名格式为：再结晶（RX）_退火温度_退火时长_序列号。