Data for "Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images"
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https://figshare.com/articles/dataset/Data_for_Non-rigid_registration_and_non-local_principle_component_analysis_to_improve_electron_microscopy_spectrum_images_/12592478
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资源简介：
Data for Yankovich, A. B., Zhang, C., Oh, A., Slater, T. J. A., Azough, F., Freer, R., Haigh, S. J., Willett, R. & Voyles, P. M. Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. Nanotechnology 27, 364001 (2016). DOI: 10.1088/0957-4484/27/36/364001
创建时间：
2020-07-01
