Data for ion implantation of magnesium guests into type II silicon clathrate films, an alternate approach to doping a cage-like silicon allotrope

XRD, EPR, TOF-SIMS, and RAMAN data for Ion Implantation of Magnesium Guests into Type II Silicon Clathrate Films, an Alternate Approach to Doping a Cage-like Silicon Allotrope. This work was supported by the National Science Foundation, Grant No. 2114569 (clathrate synthesis and characterization) and the Center for Integrated Nanotechnologies (CINT), proposal No. 2022BU0159 (implantation), jointly operated by Los Alamos and Sandia National Laboratories. This work was performed, in part, at the center for Integrated Nanotechnologies (CINT), an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE’s National Nuclear Security Administration (NNSA) under contract DE-NA-0003525. Los Alamos National Laboratory, an affirmative action equal opportunity employer, is managed by Triad National Security, LLC for the U.S. Department of Energy’s NNSA, under contract 89233218CNA000001. This material makes use of the TOF-SIMS system at the Colorado School of Mines, which was supported by the National Science Foundation under Grant No.1726898.