IODP Expedition 396 Color reflectance

Color reflectance data were measured on section halves using an integration sphere and a UV-VIS spectrophotometer mounted on the Section Half Multisensor Logger (SHMSL). Spectral counts are recorded in the range of 380 to 700 nm, covering the visible spectrum, and binned in ~2 nm bins. Spectral data are reduced from spectra and recorded in tristimulus XYZ values, CieLAB L*a*b* values, and other units.本数据集通过搭载于切片半样本多传感器记录仪（Section Half Multisensor Logger，SHMSL）的积分球（integration sphere）与紫外-可见分光光度计（UV-VIS spectrophotometer），对切片半样本开展颜色反射率数据的测量工作。光谱计数的采集范围覆盖380至700纳米的可见光光谱区间，且以约2纳米为间隔进行分箱存储。所得光谱数据经约简处理后，将以三刺激值XYZ、CIE L*a*b*色空间参数及其他单位形式进行记录。