Nb/a-Si/Nb Josephson junctions for high-density superconducting circuits

This comprehensive data set includes the electrical characterization measurements of sputtered Nb/a-Si/Nb Josephson junctions (JJs) for high-speed and high-density superconducting electronics. JJs were studied with critical current densities (Jc) ranging from 0.01 mA/?m^2 to 3 mA/?m^2 and with and without annealing at various temperatures. These properties indicate that Nb/a-Si/Nb Josephson junctions are a potential candidate to extend the speed and circuit density of superconducting electronics to 50 nm diameter (25 mA/?m^2) JJs.

本数据集全面收录了溅射制备的Nb/a-Si/Nb约瑟夫森结（JJs）的电学特性测量数据，旨在研究高速高密度超导电子学。约瑟夫森结的临界电流密度（Jc）范围从0.01 mA/μm²至3 mA/μm²，并考察了不同温度下是否有退火处理的情况。这些特性表明，Nb/a-Si/Nb约瑟夫森结有望成为将超导电子学的速度和电路密度扩展至50 nm直径（25 mA/μm²）约瑟夫森结的潜在候选者。