Mapping the Rare Earth Magnetization profile in designed compositionally-graded GdCoFe ferrimagnetic alloy films for spintronic applications.

This experiment aims to map the local variations of Gd magnetization profile through the thickness of GdFeCo ferrimagnetic films with a deliberately designed Gd variation through the film thickness. Hard X-ray resonant dichroism and magnetic reflectivity (XRMR) at the Gd L3 edge (7.24 keV) will be used to map the Gd magnetization profile through the film thickness. Temperature dependent XRMR measurements through compensation, combined with SIMS and SQUID magnetometry, will enable us to understand the evolution of the global and local compensation behaviour. This approach offers a comprehensive understanding of magnetization behaviour arising from compositional non-uniformities and their influence on the evolution of ferrimagnetic compensation in RE:TM alloys for spintronics.

本实验旨在针对钆铁钴（GdFeCo）亚铁磁薄膜，通过在其厚度方向精准设计钆（Gd）组分分布梯度，表征薄膜厚度方向上钆磁化分布的局域变化特征。实验将借助Gd L3吸收边（7.24 keV）处的硬X射线共振磁二向色性与磁反射（XRMR, X-ray Resonant Magnetic Reflectivity）技术，绘制薄膜厚度方向的钆磁化分布图谱。结合补偿区间内的变温XRMR测量、二次离子质谱（SIMS, Secondary Ion Mass Spectrometry）与超导量子干涉仪（SQUID, Superconducting Quantum Interference Device）磁表征手段，本研究可阐明全局与局域磁补偿行为的演化规律。该研究方法可为自旋电子学领域中稀土-过渡金属（RE:TM）合金因组分不均匀性引发的磁化行为，及其对亚铁磁补偿演化的影响提供全面深入的认知。