TOF-SIMS depth profiling data of a transfected HEK cell
收藏DataCite Commons2025-08-26 更新2026-05-03 收录
下载链接：
https://databank.illinois.edu/datasets/IDB-5513643
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资源简介：
This dataset consists of the time-of-flight secondary ion mass spectrometry (TOF-SIMS) depth profiling data that was collected with a PHI nanoTOF II Parallel Imaging MS/MS instrument from a 70 micron by 70 micron region on a recombinant HEK cell labeled with a stain that accumulates in the endoplasmic reticulum (ER-Tracker Blue White DPX, Invitrogen).
提供机构：
University of Illinois Urbana-Champaign
创建时间：
2025-08-26
