X-ray Fluorescence Ghost Imaging - CuSn mask - Three Wires (Fe & Cu)

X-ray Fluorescence Ghost Imaging (XRF-GI) dataset of three wires (one Fe, and two Cu) in a plastic capillary. The capillary contains trace elements like Zn, Zr, etc. The GI scan is presented in the following article 10.1364/OL.499046. A total of 896 GI realizations were taken, organized into 16 vertical translations and 56 horizontal translations of the structuring element (CuSn mask). The dataset contains both the sample transmission images and the masks plus sample transmission images. No images of the masks are provided (they need to be computed). The data is organized in an HDF5 file, under the following structure: dataset_CuSn-mask_3wires.h5
│
├data
│ ├flat_panel
│ │ ├dark [float32: 16 × 170 × 350]
│ │ ├empty_beam [float32: 170 × 350]
│ │ ├sample [float32: 16 × 170 × 350]
│ │ └sample_and_masks [float32: 16 × 56 × 170 × 350]
│ └xrf [float32: 16 × 56 × 4096]
│
└metadata
└xrf
├bias_keV [float64: scalar]
├gain_keV [float64: scalar]
└ranges
├Ca [int64: 2]
├Cu [int64: 2]
├Fe [int64: 2]
├Si [int64: 2]
├Ti [int64: 2]
├Zn [int64: 2]
└Zr [int64: 2]
The meaning of the paths is: /data/xrf contains the XRF spectra for each GI realization /data/flat_panel/dark contains the dark images of each scan line (no beam) /data/flat_panel/empty_beam contains the empty beam (no sample & no masks) intensity distribution /data/flat_panel/sample contains the transmission images of the sample at each scan line /data/flat_panel/sample_and_masks contains the transmission images of the sample and masks at each GI realization /metadata/xrf/bias_keV contains the bias in keV of the XRF spectrum /metadata/xrf/gain_keV contains the gain in keV of each XRF energy bin /metadata/xrf/ranges/ contains the bin ranges for interesting Kalpha elemental emission lines in the XRF spectrum For further information we refer to the associated publication. The data can be processed with structured illumination routines of the code at: https://github.com/cicwi/PyCorrectedEmissionCT.

本数据集为塑料毛细管内三根金属丝（一根铁（Fe）、两根铜（Cu））的X射线荧光鬼成像（X-ray Fluorescence Ghost Imaging, XRF-GI）数据集，毛细管内含有锌（Zn）、锆（Zr）等痕量元素。本次鬼成像扫描的相关内容发表于论文10.1364/OL.499046。本次实验共采集896组鬼成像实测数据，对应结构元素（CuSn mask）的16次垂直平移与56次水平平移。数据集包含样本透射图像，以及掩膜与样本的组合透射图像；未提供单独的掩膜图像（需通过计算获取）。数据以HDF5格式存储于dataset_CuSn-mask_3wires.h5文件中，组织结构如下：
│
├data
│ ├平板探测器（flat_panel）
│ │ ├暗场图像（dark） [float32: 16 × 170 × 350]
│ │ ├空束图像（empty_beam） [float32: 170 × 350]
│ │ ├样本透射图像（sample） [float32: 16 × 170 × 350]
│ │ └掩膜与样本组合透射图像（sample_and_masks） [float32: 16 × 56 × 170 × 350]
│ └X射线荧光光谱（xrf） [float32: 16 × 56 × 4096]
│
└元数据（metadata）
└X射线荧光光谱（xrf）
├keV偏置（bias_keV） [float64: scalar]
├keV增益（gain_keV） [float64: scalar]
└能谱区间（ranges）
├钙（Ca） [int64: 2]
├铜（Cu） [int64: 2]
├铁（Fe） [int64: 2]
├硅（Si） [int64: 2]
├钛（Ti） [int64: 2]
├锌（Zn） [int64: 2]
└锆（Zr） [int64: 2]
各路径含义如下：/data/xrf 存储每组鬼成像实测对应的X射线荧光光谱；/data/flat_panel/dark 存储每条扫描线的暗场图像（无束流状态）；/data/flat_panel/empty_beam 存储空束（无样本与掩膜）的强度分布；/data/flat_panel/sample 存储每条扫描线下的样本透射图像；/data/flat_panel/sample_and_masks 存储每组鬼成像下的掩膜与样本组合透射图像；/metadata/xrf/bias_keV 存储X射线荧光光谱的keV偏置值；/metadata/xrf/gain_keV 存储每个XRF能量通道的keV增益值；/metadata/xrf/ranges/ 存储X射线荧光光谱中各特征元素Kα发射谱线对应的能谱区间。如需获取更多详细信息，请参阅相关发表论文。该数据集可通过https://github.com/cicwi/PyCorrectedEmissionCT 中的结构化照明处理代码进行预处理。