IODP Expedition 384 X-ray fluorescence (XRF)

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions.岩芯分半样品的元素峰强度由Avaatech X射线荧光（XRF）岩芯扫描仪于航次后完成测定。为激发并测定特定范围的元素（例如针对轻元素采用10kV且无滤光片的条件），每个测量位置可在多种XRF参数下完成测量。随后将峰强度变化（未提供元素浓度）用于辅助识别并划分主要化学地层单元，无需进行破坏性采样。数据按岩芯段及能量/仪器条件整理为逗号分隔值（CSV）格式文件。