Dataset supporting the publication "Solution-Processed Low Resistivity Zinc Oxide Nanoparticle Film with Enhanced Stability using EVOH"

This dataset supports the publication "Solution-processed low resistivity zinc oxide nanoparticle film with enhanced stability using EVOH", ACS Applied Electronic Material. The dataset includes test results for Figure 4 that can be viewed in excel format. The figures are as follows: Figure 4. a) The resistance of interdigitated device without any passivation obtained after different UV-vacuum-heating times. The samples were exposed to the 365 nm wavelength UV and heated to 190 °C in 10-2 mbar vacuum condition. Figure 5. Measured time dependent sheet resistance changes. The sheet resistance is calculated from the measured resistance of the device to its W/L ratio (See Figure S2e). The lines joining the dots are only for eye guide. Figure 7. Measured O 1s XPS spectra of ZnO NP film, a) with EVOH passivation and UV-vacuum-heat process b) without the passivation and the UV-vacuum-heat process. Related projects: Royal Academy of Engineering under the Chairs in Emerging Technologies Scheme

本数据集用于支撑发表于《ACS Applied Electronic Material》的论文《采用乙烯-乙烯醇共聚物（EVOH）提升稳定性的溶液法低阻氧化锌纳米颗粒薄膜》。本数据集包含可通过Excel格式查看的图4测试结果。相关附图如下：
图4：a) 未施加任何钝化处理的叉指器件在不同紫外-真空-加热时长后的电阻值。测试时，样品置于365 nm波长紫外光下，并在10⁻² mbar的真空环境中加热至190 ℃。
图5：实测的随时间变化的方块电阻变化曲线。方块电阻通过器件实测电阻与其宽长比（W/L）计算得到（参见补充图S2e）。图中连接数据点的线条仅为辅助目视观察的参考线。
图7：氧化锌纳米颗粒（ZnO NP）薄膜的O 1s X射线光电子能谱（XPS）：a）施加EVOH钝化并经紫外-真空-加热处理的样品；b）未施加钝化处理且未经过紫外-真空-加热处理的样品。
相关资助项目：英国皇家工程院新兴技术讲席计划（Royal Academy of Engineering under the Chairs in Emerging Technologies Scheme）