X-ray diffraction data of adhesive tapes for the top dusted sample preparation method

The top-dusted method is one approach to prepare small-volume powder samples for the X-ray diffraction analysis in a Bragg-Brentano setup. Typically, a carrier material and an adhesion promoter are used. Instead, adhesive tapes can be used, combining the function of the carrier material and adhesion promoter. When selecting an adhesive tape, a priory knowledge of the background signal caused by the adhesive tape is not possible based solely on data sheets. Therefore, the X-ray diffraction behavior of commercially available adhesive film tapes for office and packing applications is studied. The diffractograms are provided in this data set. This enables XRD users to choose an adhesive tape for the top-dusted method best suiting their purpose. For the sake of comparison, the diffractograms of a deep well PMMA sample holder, a zero background sample holder (with and without vaseline as adhesion promoter), and a microscopy glass slide are provided.

The data correspond to a publication entitled : “Top dusted adhesive tape sample preparation method for the X-ray diffraction (XRD) analysis of small powder sample volumes with the Bragg-Brentano setup”.

顶置撒样法（top-dusted method）是一种用于布拉格-布伦塔诺（Bragg-Brentano）装置下X射线衍射（X-ray Diffraction, XRD）分析的小体积粉末样品制备方法。该方法通常需搭配载体材料与助粘剂使用。相较之下，胶带可同时承担载体材料与助粘剂的双重功能。但在选用胶带时，仅依靠产品说明书无法预先获知其自身引发的背景衍射信号。为此，本数据集针对市售办公与包装用胶粘薄膜胶带的X射线衍射行为开展研究，并提供所测得的全部衍射图谱。此举可帮助XRD使用者挑选最贴合自身实验需求的顶置撒样法用胶带。为便于对比分析，本数据集同时提供了深孔聚甲基丙烯酸甲酯（PMMA）样品架、零背景样品架（分别搭配与不搭配凡士林作为助粘剂）以及显微镜载玻片的衍射图谱。
本数据集对应发表论文，其标题为《采用布拉格-布伦塔诺装置开展小体积粉末样品X射线衍射（XRD）分析的顶置撒样胶带制备法》。