Cross-Modal Characterization of Thin film MoS2 using Generative Models
收藏DataCite Commons2025-07-21 更新2026-05-05 收录
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This data package includes information on sample preparation, growth conditions, and characterization results for atomic force microscopy images, Raman spectroscopy and photoluminescence spectroscopy (PL) of MoS2. Samples used to train and evaluate the machine learning models for the project reported in the main body of the manuscript entitled “Cross-Modal Characterization of Thin Film MoS2 Using Generative Models ”. by Isaiah A. Moses, Chen Chen, Joan M. Redwing, and Wesley F. Reinhart. The TMDs samples were grown by metal organic chemical vapor deposition (MOCVD) in the NSF 2D Crystal Consortium facility at Penn State. The data includes recipe files from the MOCVD1 system and data files from AFM, Raman, and PL.
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scholarsphere
创建时间:
2025-07-21



