Probing Spatial Variation in AFM-Measured Adhesion: Implication of Distributed Nanoscale Charge Heterogeneity

The adhesion forces between a microsphere and a silica substrate were measured using AFM. NaCl solutions at concentrations of 0.001 M, 0.005 M, 0.01 M, 0.05 M, and 0.1 M were used sequentially to measure the adhesion forces.本研究通过原子力显微镜（Atomic Force Microscope，AFM）测定微球与二氧化硅基底之间的粘附力，实验中依次采用浓度分别为0.001 M、0.005 M、0.01 M、0.05 M与0.1 M的氯化钠溶液进行测试。