Auger recombination in low temperature silicon measured by photo-MuSR technique
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We measure electron-hole recombination rate in low-temperature pure silicon using the photo-MuSR technique. The previous works have measured the recombination rate down to -30...
本研究采用光缪子自旋共振（photo-MuSR）技术，对低温纯硅中的电子-空穴复合率开展测量。此前已有相关研究将该复合率的测量下限拓展至-30……
